The I-PEX test head is designed for RF testing and high-frequency signal connection applications. Its compact structure supports convenient testing and debugging of electronic devices and wireless communication products, providing a stable interface for RF test equipment.

With a 50Ω characteristic impedance and a frequency range of DC to 3GHz, it is suitable for various high-frequency signal testing applications. Its stable electrical performance helps maintain reliable signal transmission during testing and measurement.

The test head also provides high dielectric withstand voltage and insulation resistance, with mating durability of up to 500 cycles. Its operating temperature range of -55°C to +125°C allows reliable operation across a wide range of testing environments.